Jije Labglass plc

Agilent Technologies


Uses X-rays to non-destructively measures the residual stress accumulated in a material during the manufacturing process. Different frame sizes accommodate small, medium and large samples.

The position-sensitive proportional counter (PSPC) permits high-speed measurement. Compared with the conventional method, the measurement time can be reduced drastically, 10 to 100 times faster depending upon the kind of measurement. This is a field-oriented X-ray stress analyzer that enables the operator to immediately get the ultimate data on the stress value from a simple operation.

Measurement principle

Incident X-rays are diffracted from specific lattice planes of the crystal grains. The diffracted X-rays enter the PSPC (with length L) and collide with the detector gas, ionizing the molecules. A high voltage is applied across the cathode and anode so that the induced electric charges are collected on the cathode at a position χ.

The corresponding pulses appear at both ends of a delay line after a lapse of time proportional to the incidence position χ. When the delay time per unit length is denoted by D and the time required to produce the output at Preamp A and Preamp B by TA and TB respectively, then the following equations hold:




Therefore the difference of output time between the two amplifiers (TB-TA) is proportional to the position χ. Since the delay time is less than 1.3 μsec, measurement can be carried out virtually simultaneously over the effective length L.




Quick link

JIJE LaboGlass

Nifas Silk Lafto Sub City, Woreda 01, Lebu, Foziana Building 6th Floor, Infront of Varnero Real Estate, Addis Ababa
+251-113-720-701/2 +251-911-662-491

Social media & sharing icons powered by UltimatelySocial